Prof. Dr. Jenő Gubicza

PhD., Dr.habil., DSc

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Department of Materials Physics
Eötvös Loránd University, Budapest

Address:  
Pázmány Péter sétány 1/A.
Budapest, Hungary
H-1117

Postal address: P.O.Box 32, H-1518, Hungary

Tel.: +36-1-372-2876
Fax.: +36-1-372-2811

e-mail:  jeno.gubicza at ttk.elte.hu

Curriculum vitae: in English, in Hungarian



Research

Research interest:

Indentation techniques
X-ray diffraction line profile analysis
Microstructure and mechanical properties of nanocrystalline materials

Publications

Books:

J. Gubicza: Defect Structure and Properties of Nanomaterials, 2nd and Extended Edition, Woodhead Publishing, an imprint of Elsevier, Duxford, UK, ISBN: 9780081019177 (2017)

Details: https://www.elsevier.com/books/defect-structure-in-nanomaterials/gubicza/978-0-08-101917-7

Review on this book: M. Kawasaki, Microscopy and Microanalysis 24 (2018) 323 

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J. Gubicza: X-ray line profile analysis in Materials Science, IGI-Global, Hershey, PA, USA, ISBN: 978-1-4666-5852-3 (2014)

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Details: http://www.igi-global.com/book/ray-line-profile-analysis-materials/94910

Review on this book:

"The author set out to provide a survey of the field of X-ray line profile analysis (XLPA) for the materials sciences.
The book covers basic and advanced XLPA, and attempts to fill in the gaps in the current literature.
From my perspective, the author has done a reasonably good job."

Joseph D. Ferrara, Ph.D., Chief Science Officer, Rigaku (published in the newsletter "The Bridge", Issue 12, June, 2014)

Errata
 


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J. Gubicza: Defect structure in nanomaterials, Woodhead Publishing Ltd., Cambridge, UK, ISBN: 978-0-85709-206-9 (2012)

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Details: http://store.elsevier.com/product.jsp?isbn=9780857092069&pagename=search

Book chapters:

T. Ungár, E. Schafler, J. Gubicza: Microstructure of Bulk Nanomaterials Determined by X-Ray Line Profile Analysis,
in the book entitled BULK NANOSTRUCTURED MATERIALS, eds.: M.J. Zehetbauer and Y.T. Zhu,
WILEY–VCH, (2009) pp. 361-386 (
ISBN: 978-3-527-31524-6)

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J. Gubicza, J. Lendvai: Formation of quasicrystals in bulk metallic glasses and their effect on mechanical behavior,
in the book entitled: Quasicrystals: Types, Systems, and Techniques, Editor: Beth E. Puckermann,
Nova Science Publishers, Inc. Hauppauge, NY (2010), chapter 6, pp. 147-161 (ISBN: 978-1-61761-123-0).

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List of publications with number of references in the MTMT system of the Hungarian Academy of Sciences

Activity in PhD and DSc qualification processes

Research team

Former supervised students

X-ray line profile analysis: a training course from basics to practice, May 23-25, 2011



Education

Chapter "Single-crystal X-ray diffraction" for "Applied Physical Methods Laboratory" (in Hungarian)

Chapter "X-ray line profile analysis" for "Applied Physical Methods Laboratory" (in Hungarian)

Chapter "X-ray diffraction" for "Advanced Experimental Methods Laboratory exercises" (in Hungarian)

Chapter "Depth-sensing nano- and microindentation" for "Advanced Experimental Methods Laboratory exercises" (in Hungarian)

Lists of topics for the examination "Lattice defects I" (in English)

Lists of topics for the examination "Lattice defects II" (in English)

Lists of topics for the examination "Bulk nanostructured materials" (in English)

Lists of topics for the examination "Diffraction methods in materials science I"  (in English)

Lists of topics for the examination "Physical methods for processing new materials" (in English)

Vizsgatematika a "Bevezetés az anyagtudományba" című előadáshoz

Vizsgatematika a "Fejezetek az anyagtudományból és a szilárdtestfizikából" című előadáshoz

Vizsgatematika az "Alkalmazott statisztika" című előadáshoz

Ajánlott irodalom az "Alkalmazott statisztika" című előadáshoz:
Havancsák Károly: Mérési adatok kezelése és értékelése


Smartlab schedule