Prof. Dr. Jenő
Gubicza
PhD., Dr.habil., DSc
Department of Materials Physics
Eötvös Loránd University, Budapest
Address:
Pázmány Péter sétány 1/A.
Budapest, Hungary
H-1117
Postal address: P.O.Box 32, H-1518, Hungary
Tel.: +36-1-372-2876
Fax.: +36-1-372-2811
e-mail: jeno.gubicza at ttk.elte.hu
Curriculum vitae: in English, in Hungarian
Research
Research interest:
Indentation techniques
X-ray diffraction line profile analysis
Microstructure and mechanical properties of nanocrystalline materials
Publications
Books:
J. Gubicza: Defect Structure and Properties of Nanomaterials, 2nd and Extended Edition, Woodhead Publishing, an imprint of Elsevier, Duxford, UK, ISBN: 9780081019177 (2017)
Details: https://www.elsevier.com/books/defect-structure-in-nanomaterials/gubicza/978-0-08-101917-7
Review on this book: M. Kawasaki, Microscopy and Microanalysis 24 (2018) 323
---------------------------------------------------------------------------------------------------------------------------------------------
J. Gubicza: X-ray line profile analysis in Materials Science, IGI-Global,
Hershey, PA, USA, ISBN: 978-1-4666-5852-3 (2014)
Details: http://www.igi-global.com/book/ray-line-profile-analysis-materials/94910
Review on this book:
"The author set out to provide a survey of the field of X-ray line profile
analysis (XLPA) for the materials sciences.
The book covers basic and advanced XLPA, and attempts to fill in the gaps in
the current literature.
From my perspective, the author has done a reasonably good job."
Joseph D. Ferrara, Ph.D., Chief Science Officer, Rigaku (published in the
newsletter "The Bridge", Issue 12, June, 2014)
Errata
---------------------------------------------------------------------------------------------------------------------------------------------
J. Gubicza: Defect structure in nanomaterials, Woodhead Publishing Ltd.,
Cambridge, UK, ISBN: 978-0-85709-206-9 (2012)
Details: http://store.elsevier.com/product.jsp?isbn=9780857092069&pagename=search
Book chapters:
T. Ungár, E. Schafler, J.
Gubicza: Microstructure of Bulk Nanomaterials Determined by X-Ray Line Profile
Analysis,
in the book entitled BULK NANOSTRUCTURED MATERIALS, eds.: M.J. Zehetbauer and
Y.T. Zhu,
WILEY–VCH, (2009) pp. 361-386 (ISBN: 978-3-527-31524-6)
frontpage
backpage
J. Gubicza, J. Lendvai: Formation of quasicrystals in bulk metallic glasses and
their effect on mechanical behavior,
in the book entitled: Quasicrystals: Types, Systems, and Techniques, Editor:
Beth E. Puckermann,
Nova Science Publishers, Inc. Hauppauge, NY (2010), chapter 6, pp. 147-161
(ISBN: 978-1-61761-123-0).
frontpage
backpage
List of publications with number of references in the MTMT system of the Hungarian Academy of Sciences
Activity in PhD and DSc qualification
processes
Former supervised students
X-ray line profile analysis: a training
course from basics to practice, May 23-25, 2011
Education
Chapter "Single-crystal X-ray
diffraction" for "Applied Physical Methods Laboratory" (in Hungarian)
Chapter "X-ray line profile
analysis" for "Applied Physical Methods Laboratory" (in Hungarian)
Chapter "X-ray
diffraction" for "Advanced Experimental Methods Laboratory exercises" (in Hungarian)
Chapter "Depth-sensing nano-
and microindentation" for "Advanced Experimental Methods Laboratory
exercises" (in Hungarian)
Lists of topics for the examination "Lattice defects I" (in English)
Lists of topics for the examination "Lattice defects II" (in English)
Lists of topics for the examination "Bulk nanostructured materials" (in English)
Lists of topics for the examination "Diffraction methods in materials science I" (in English)
Lists of topics for the examination "Physical methods for processing new materials" (in English)
Vizsgatematika a "Fejezetek az anyagtudományból és a szilárdtestfizikából" című előadáshoz
Vizsgatematika az "Alkalmazott statisztika" című előadáshoz